The JIMA resolution test chart JIMA RT RC-04 of Japan Inspection Instruments Manufacturers' Association is a micro chart fabricated by using the latest semiconductor lithography techniques. It is used for calibration and monitoring of system resolution and ensures high quality results of your microfocus or nano-resolution X-ray inspection systems. JIMA RT RC-04 supports resolutions between 0.1 microns and 10 microns. This corresponds to focal spot sizes between 0.2 microns and 20 microns.
Layout + case and cross section
Layout + case of JIMA RT RC-04 resolution test chart
Structure of JIMA RT RC-04 resolution test chart
JIMA RT RC-04 resolution chart
JIMA RT RC-04 resolution test chart
Technical data
- Line and space size: 0.1, 0.15, 0.2, 0.25, 0.3, 0.35, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, 1.0, 1.5, 2.0, 3.0 ,4.0 ,5.0 ,6.0, 7.0, 8.0, 9.0,10.0 µm (line and space are same width)
- Each slit consists of 8 lines, T-shape layout
- Absorption material: tungsten, thickness >= 650nm
- Protection film: PET-film 25 μm (including bonding layer)
- Silicium-base: 15 µm +/- 1 µm (thickness)
- Housing size: 40 x 30 x 5 mm (W x H x D)
- Chip size: 5 x 5 x 0.06 mm (W x H x D)
- Pattern precision: tolerance: +/- 10%
- Operation temperature range: 10°C to 70°C
- Supplied in a air suspension case with test report
Recommended application
Note: Minimize the duration of radiation. Switch off X-rays during the procedure. The heat in front of the target may damage the test chart.
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